Guide for Atomic Force Microscopy Image Analysis To Discriminate Heteroatoms in Aromatic Molecules
نویسندگان
چکیده
منابع مشابه
Image Processing for Precision Atomic Force Microscopy
Atomic Force Microsopy (AFM) is an increasingly popular means of obtaining accurate metrological data of surface topography. The AFM measures surface topography by recording the vertical motion of a probe as it traces the profiled surface in a raster fashion. However, the metrological accuracy of AFM images is limited by image convolution between the probe tip and the sample surface. As a resul...
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ژورنال
عنوان ژورنال: Energy & Fuels
سال: 2019
ISSN: 0887-0624,1520-5029
DOI: 10.1021/acs.energyfuels.9b00165